014747232

AFM-Contour

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October 30, 2015

Trademark Summary

The trademark application AFM-Contour was filed by ANTON PAAR GmbH, a corporation established under the laws of the Republic of Austria (the "Applicant"). The application was published for oppositions on February 17, 2016, and it was registered by office on May 26, 2016 without any oppositions.

The application was filed in German (English was selected as the second language).

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Goods And Services

• The mark was filed in class 9 with following description of goods:
  
  1. Computer software for measuring instruments, in particular for atomic force microscopes (AFMs)
  2. Computer software for operation of measuring instruments, in particular for surface characterisation and data analysis
  3. Computer software for data analysis, in particular of data generated by an AFM.
• The mark was filed in class 37 with following description of goods:
  
  1. Installation, construction and repair of scientific and measuring apparatus and instruments
  2. Installation of scientific measuring apparatus and instruments
  3. Information and consultancy relating to all the aforesaid
  4. All services being in particular in relation to atomic force microscopes.
• The mark was filed in class 42 with Scientific and technological services and research and design relating thereto and All of the aforesaid services being in particular in relation to atomic force microscopes, data analysis and imaging..