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EUTM file information

018525463

NOVACAM


July 29, 2021

Trademark Summary

The trademark application NOVACAM was filed by NOVACAM TECHNOLOGIES INC., a corporation established under the laws of Canada (the "Applicant"). The application was published for oppositions on September 15, 2021, and it was registered by office on December 23, 2021 without any oppositions.

The application was filed in English (German was selected as the second language).

Change of name and address of the trademark registration was recorded on January 17, 2023.


Goods And Services

  • The mark was filed in class 9 with following description of goods:
    1. Non-contact optical 3D metrology systems for measurement of 3D geometry, thickness, roughness, and/or defects
    2. Non-contact optical 3D metrology systems for measurement of 3D geometry, thickness, roughness, and/or defects with respect to bores
    3. Non-contact optical 3D metrology systems for measurement of 3D geometry, thickness, roughness, and/or defects with respect to tubes
    4. Profilometers
    5. Optical 3D metrology devices
    6. 3D metrology devices for surface inspection
    7. 3D metrology devices for edge inspection
    8. Interferometers
    9. Coordinate measuring machines
    10. Optical coherence tomography systems
    11. Optical probes for performing metrology.
  • The mark was filed in class 35 with following description of goods:
    1. Wholesale, retail and internet sales of non-contact optical 3D metrology systems for measurement of 3D geometry, thickness, roughness, and/or defects
    2. Wholesale, retail and internet sales of non-contact optical 3D metrology systems for measurement of 3D geometry, thickness, roughness, and/or defects with respect to bores
    3. Wholesale, retail and internet sales of non-contact optical 3D metrology systems for measurement of 3D geometry, thickness, roughness, and/or defects with respect to tubes
    4. Wholesale, retail and internet sales of profilometers, optical 3D metrology devices, 3D metrology devices for surface inspection, 3D metrology devices for edge inspection, interferometers, coordinate measuring machines, optical coherence tomography systems
    5. Optical probes for performing metrology.